J A Woollam Co, Inc

You are viewing information about J A Woollam Co, Inc, a provider of Spectroscopy Laboratory Instruments.

Description: Spectroscopic ellipsometers for thin film and bulk materials chacterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.

Summary: jawoollamcom - Ellipsometry Solutions -

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Information: Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more.

URL: http://www.jawoollam.com/