J A Woollam Co, Inc
You are viewing information about J A Woollam Co, Inc, a provider of Spectroscopy Laboratory Instruments.
Description: Spectroscopic ellipsometers for thin film and bulk materials chacterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
Summary: jawoollamcom - Ellipsometry Solutions -
Information: Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more.